ISMTII2017@西安にて，孔君，叶君，橘君が発表，高橋が招待講演
ISMTII2017（13th International Symposium on Measurement Technology and Intelligent Instruments）が，2017年9月22日〜25日の日程で，中国西安にて開催されました．
当研究室からは，孔徳卿君（D2），叶世蔚君（D2），橘一輝君（D1）が研究発表を，高橋が招待講演をしました．
孔：In-process measurement on the thickness of photosensitive resin inevanescent wave-based nano-stereolithography.
叶：Experimental verification of a novel in-process depth measurements of sub-diffraction limited micro-groove based on near-field optical response.
橘：Development of nanoparticle detection method based on a new principle combining volatile liquid and optical observation method: Study of highly sensitive optical detection system.
高橋：High sensitive and super resolution optical inspection of nanodefects on Si wafer surface using infrared standing evanescent wave.
